Non-destructive X-ray Diffraction Tomography with Cone-Beam CT Systems

In this paper we describe a novel approach for introducing true material selectivity as a fourth dimension into cone-beam CT (CBCT) imaging by integrating means for energy-dispersive X-ray diffraction (EDXRD) measurements into the system. In order to minimize the acquisition time for the diffraction data, a compressed sensing reconstruction scheme requiring only a dilute set of projections was developed. The ‘basis’ vectors, enabling a sparse representation of the spatial material distribution, are derived from the conventional CT image data set. Thereby a priori information from CBCT is effectively utilized for reduction of measurement time in the diffraction scan. To demonstrate the capability of our method, visualizing the local charge distribution inside a commercially available Li-ion Battery was chosen as an example.